Testex Digital Micrometer Thickness Gage (RTM-type)
The Testex Digital Micrometer supports modern surface profile measurement by offering built-in conversion, memory, and data export. When replica tape is removed, it should return to –50 µm (i.e. zero reference). The instrument includes menu navigation for modes, units, and data handling, ensuring consistent usage.
Features
When a replica tape grade is selected, the device subtracts the 50 µm backing automatically.
Stores up to 250 readings; displays min, max, average, count.
Applies correction for tape non-linearity when enabled.
Can toggle between metric and imperial display units.
Data can be downloaded as .csv via USB, no extra software needed.
Overview
| Specification | Value / Description |
|---|---|
| Replica tape backing thickness | 50 µm (2 mil) polyester backing layer |
| Memory capacity | Up to 250 readings stored |
| Units | Microns (µm) and mils (button-selectable) |
| Automatic zeroing | Zeroes on power-up and can also be zeroed via menu (if anvils clean) |
| Modes | Memory Mode, Averaging Mode, Conversion Mode, Tape Grade selection |
| Accuracy statements | Coarse: ±2 µm precision, ±8 µm accuracy; X-Coarse: ±6 µm precision, ±8 µm accuracy; X-Coarse Plus: ±8 µm precision, ±10 µm accuracy. |
| Selector for replica tape grade | C (Coarse), XC (X-Coarse), XC+ (X-Coarse Plus) |
| Data export | USB-C port; USB Drive Mode (appears as flash drive) for .csv export |
| Menu / navigation | Button interface to select modes, units, clear memory, etc. |
| Anvil cleaning requirement | Clean anvils if reading doesn’t return to –50 µm when replica removed |








