Intended for field and lab use, the DTG-M offers a spring-loaded dial micrometer to read surface roughness replicates in metric units. When used in combination with Testex replica tape, it provides cost-effective, repeatable measurements of blast-cleaned steel surface profiles

Testex DTG-M Dial Thickness Gage (Metric)

The Testex DTG-M Dial Thickness Gage (Metric) enables non-destructive evaluation of steel surface topography using compressed replica tape. It supports the ASTM Method C technique by yielding maximum peak-to-valley depth. Rugged, easy to operate, and effective for quality assurance tasks.

Features

Mechanical spring-loaded dial

Uses a micrometer to directly measure the compressed thickness of a tape replica

Metric unit scale

Readings given in metric (µm) suitable for applications requiring SI units

Compatible with Testex replica tape

Designed specifically to be used with Testex Press-O-Film tape to obtain surface profiles

ASTM D4417 Method C support

Enables measurement conforming to the “replica tape + micrometer” method

Simple, rugged design

Low-maintenance mechanical tool suited for field or workshop environments

Overview

Specification	Value / Description
Model / type	DTG-M Dial Thickness Gage (Metric)
Use / application	For measurement of blast surface profile via Testex replica tape
Principle	Spring-loaded micrometer measuring compressed foam impression
Measurement method	Compress replica tape, read dial, subtract backing thickness to obtain peak-to-valley depth
Units	Metric (µm)
Compatibility	Works with Testex Press-O-Film replica tape
Ruggedness / design	Mechanical, minimal electronics, suitable for field use